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Crystallographic algorithms and computer programs play significant roles in materials’ characterization. A software package for the quantitative characterization of crystallographic texture, under axial symmetry conditions, is presented. The proposed methodology is intended for use with both electrons and high-energy synchrotron X-rays. Three different programs are introduced. Anaelu and Grazing are based on the Rietveld modelling approach. Dianne follows the Bunge’s symmetrized spherical harmonics method. A SrTiO3 model sample is proposed as a hypothetical study case.