An expression has been developed whereby coincidence losses occurring in an x-ray spectrometer unit can be readily evaluated. Equivalent departures from linearity are given when the x-ray tube is operated at constant potential, full-wave, and half-wave rectified. A quantitative relationship is obtained between the apparent increase in the absorption factor (for a foil of a fixed thickness) at high counting rates and the peak operating voltage of the x-ray tube for a given element.

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