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Using a total of 1052 Bragg reflections of silicon, an X-ray investigation has been carried out to deduce the anharmonic thermal parameter jj', apart from the estimation of the harmonic contribution of the thermal vibration at room temperature. Reflections of type h + k + I = 4n, and 4n & 1 were used to estimate these parameters using MoKa radiation and a Nonius CAD-4 X-ray diffractometer. We obtain Bsi = 0.451 (0.008) A' and Bsi = 0.279(2.630) eV k 3 with R = 3.12%. The present B and jj' values are in very good agreement with the earlier studies.

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