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Discussion of the Bistatic Scattering Coefficients Averaged over 30 Realizations Figure 7 shows the simulation of the bistatic-scattering coefficients averaged over 30 realizations through the UV method. The rms heights are 0.03, 0.06, and 0.09, respectively, and all of their correlation lengths are 1.03, the permittivity of the dielectric rough surface is 1 ϭ 10.8 Ϫ j1.6. The surface lengths are 8 ϫ 8 wavelengths and the incidence angle is 30°. The reflectivity of the dielectric rough surface is calculated through integral over above space. Figure 7 shows that the backscattering coefficient will increase with rms height increasing, as does the reflectivity. The CPU time of the UV method will also increase for iteration number's increase. Meanwhile, the specular scattering coefficient will decrease, as opposed to increase of the rms height. CONCLUSIONIn this paper, the UV-MLP method has been used for a rapid solution of the integral equation in 3D dielectric rough-surface scattering. The method can be applied to 3D PEC rough-surface scattering, and volume scattering of moderate-size particles using high-order spherical-wave Green's functions. Presently, the case of vector electromagnetic wave scattering by lossy dielectric random rough-surfaces is being studied.

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