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Quantum cellular automata (QCA) is a new technology in nanometer scale as one of the alternatives to nano cmos technology, QCA technology has large potential in terms of high space density and power dissipation with the development of faster computers with lower power consumption. This paper considers the problem of reliability analysis of Simple QCA circuits at layout level like QCA latches and NOT circuit. The tool used to tackle this problem is Bayesian networks (BN) that derive from convergence of statistics and Artificial Intelligence. QCA circuit is transformed in to Bayesian framework for getting the probability of correct output and Reliability analysis performed on the resulting circuits for finding the defective cells in QCA circuit. This will increase overall efficiency of circuit and hence speed of the circuit with lower power consumption.