No abstract

ABSTRACT. (NiO) 1-x (CuO) x Thin Films have been deposited on glass substrates by chemical spray paralysis technique for with different ratios at temperature (375±10) °C with spray rate 4s./1min. The structural properties of thin films have been investigated by the study of X-Ray diffraction analysis and morphological by study atomic forces microscope (AFM) . From the XRD result showed all simples are polycrystalline and various structural parameters were calculated. all the films show most preferred orientation along (111), (200) and (220) planes. The (AFM) results shows that the roughness decreases with mixing ratios.

(NiO)1-x(CuO)x Thin Films have been deposited on glass substrates by chemical spray paralysis technique for with different ratios at temperature (375±10) °C with spray rate 4s./1min. The structural properties of thin films have been investigated by the study of X-Ray diffraction analysis and morphological by study atomic forces microscope (AFM) . From the XRD result showed all simples are polycrystalline and various structural parameters were calculated. all the films show most preferred orientation along (111), (200) and (220) planes. The (AFM) results shows that the roughness decreases with mixing ratios.