Предложен новый подход определения величины средних деформаций по картинам дифракции обратно рассеянных электронов в локальных участках поликристаллических образцов с решёткой алмаза. Для анализа изменений формы и площади профиля интенсивности полос Кикучи использовано дискретное двумерное Фурье-преобразования картин Кикучи и их энергетический Фурье-спектр. Степень размытия полос на картинах Кикучи связана с величинами деформации, которые количественно описываются через изменения среднего радиального периода и площади радиального распределения энергетического спектра изображения.

A discrete two-dimensional Fourier transform and the power Fourier spectrum are used for determination of average strains near cracks in a welded seam of Ni-Cr-Fe alloy. The alignment of Kikuchi images with the help of genetic algorithms and subtraction of white Gaussian noise made it possible to more fully take into account the influence of instrumental factors on the formation of electron backscatter diffraction patterns.

This article presents the results of research on multi-layered heterostructures by a modified calculation technique of multiple X-ray diffraction. The AlxIn1−xSb heterostructure and a Zn(Mn)Se/GaAs(001) multi-layered system were used as models to specify conditions for cases of coincidental coplanar three-beam or coincidental noncoplanar four-beam X-ray diffraction. These conditions provide the means for a high-precision determination of lattice parameters and strain anisotropy in layers.

The defective structure of p-CdTe:Cl single crystals and MoOx/p-CdTe/MoOx heterostructures were investigated by high-resolution X-wave diffractometry methods. Different models of dislocation systems were used and the dislocation densities were estimated from the Williamson-Hall plot. It is noted that significant deformations of the mismatch in the transition layer negatively affect the current–voltage characteristics of heterostructures.

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