This work was carried out in collaboration between all authors. Author EMG performed the formulation problem, discussion of the results, studies of the dielectric properties and the effect of fluorescence.Author performed the NSN assembly measuring equipment and experimental study of the effect of fluorescence. Author MAR preparing the samples, participate in the study and discussion the effect of fluorescence. Author KShK participate in the study of the microrelief surface of sample by atomic force microscopy. Author ShVA preparing samples for the study of the effect of fluorescence, the study of the frequency dependence of the dielectric constant and dielectric loss of the samples involved in the processing of the results. AAI participate in the preparation of samples and study the surface microrelief of samples. All authors read and approved the final manuscript.

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