This paper presents a new and eficient scheme to decompress a set of deterministic test vectors for circuits with scan. The scheme is based on the reseeding of a Multiple Polynomial Linear Feedback Shift Register (MP-LFSR) but uses variable-length seeds to improve the encoding efficiency of test vectors with a wide variation in their number of spec$ed bits. The paper analyzes the eflectiveness of this novel approach both theoretically and through extensive experiments. A modular design of the decompression hardware re-uses the same LFSR used f o r pseudo-random vector generation and scan registers to minimize the area overhead.
We consider a version of the Hospitals/Residents problem which was first defined in 1962 by Gale and Shapley [9] under the name "College Admissions Problem". In particular, we consider the Firms/Candidates problem, where each Firm wishes to hire at least one Candidate and each Candidate can be finally assigned to a single Firm. We present an efficient implementation of the Gale and Shapley "propose-and-reject" algorithm when applied to the case of the Firms/Candidates problem.
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