A microwave imaging method for nondestructive testing of perfectly conducting surfaces beyond a layered media is presented. The method is an adaptation of the surface reconstruction approach by Yapar et al. to the present problem. It is based on the analytical continuation of the measured data to the surface under test through a special representation of the scattered field in terms of Fourier transform and Taylor expansion. Then the problem is reduced to the solution of a nonlinear equation which is solved iteratively via the Newton method and regularization in the least squares sense. Numerical simulations show that defects as small as λ/500 can be recovered through the presented algorithm.