Olivier Callen scite author profile

An influence of disorder originated from the substrate/layer interface on electrical properties of CdTe:In layers was investigated by means of the Hall effect and magnetoresistance measurements at low temperatures. An estimation of a scattering rate due to interface-induced disorder is given. Characteristic features of a magnetic field dependence of magnetoresistance are explained by an influence of quantum interference of scattered electron waves both in the hopping and the free electron conductivity regimes.

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Circuit-Level Modeling of SRAM Minimum Operating Voltage Vddmin in the C40 Node

Ciampolini¹,

Gupta²,

Callen³

et al. 2012

Journal of Low Power Electronics

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New methods for the characterization of surface states density and substrate/epilayer interface states in pseudomorphic AlGaAs/InGaAs/GaAs heterostructures

Mosser

Callen

Kobbi

et al. 1999

Materials Science and Engineering: B

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Olivier Callen

A Cost-Effective Low Power Platform for the 45-nm Technology Node

Low-cost 2DEG magnetic sensor with metrological performances for magnetic field and current sensing

Influence of Interface-Induced Disorder on Classical and Quantum Conductivity of CdTe:IN Epitaxial Layers

Circuit-Level Modeling of SRAM Minimum Operating Voltage Vddmin in the C40 Node

New methods for the characterization of surface states density and substrate/epilayer interface states in pseudomorphic AlGaAs/InGaAs/GaAs heterostructures

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