We present measurements of current noise and cross-correlations in three-terminal Superconductor-Normal metal-Superconductor (S-N-S) nanostructures that are potential solid-state entanglers thanks to Andreev reflections at the N-S interfaces. The noise correlation measurements spanned from the regime where electron-electron interactions are relevant to the regime of Incoherent Multiple Andreev Reflection (IMAR). In the latter regime, negative cross-correlations are observed in samples with closely-spaced junctions.

We present current noise measurements in a long diffusive superconductor -normal metal -superconductor junction in the low voltage regime, in which transport can be partially described in terms of coherent multiple Andreev reflections. We show that, when decreasing voltage, the current noise exhibits a strong divergence together with a broad peak. We ascribe this peak to the mixing between the ac-Josephson current and the noise of the junction itself. We show that the junction noise corresponds to the thermal noise of a non-linear resistor 4kBT /R with R = V /I(V ) and no adjustable parameters.