In the process of testing System-on-chips, dealing with large test data is one of the difficult processes. In this paper for compressing the test pattern a technique is suggested. To reduce the test data volume, several compression techniques are available. Here we propose the modified selective Huffman coding algorithm, to achieve the better compression efficiency. The modified selective Huffman coding algorithm compresses the original test data pattern in to highly compacted format thereby we can reduce the test data volume with a compression ratio same as that of Huffman with less area.

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