The Debye equation with slit-smeared small angle x-ray scattering (SAXS) data is extended from an ideal two-phase system to a pseudo two-phase system with the presence of the interface layer, and a simple accurate solution is proposed to determine the average thickness of the interface layer in porous materials. This method is tested by experimental SAXS data, which were measured at 25 °C, of organo-modified mesoporous silica prepared by condensation of tetraethoxysilane (TEOS) and methyltriethoxysilane (MTES) using non-ionic neutral surfactant as template under neutral condition.

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