A multivariate analysis of the parameters that characterize the reset process in RRAMs has been performed. The different correlations obtained can help to shed light on the current components that contribute in the Low Resistance State (LRS) of the technology considered. In addition, a screening method for the Quantum Point Contact (QPC) current component is presented. For this purpose the second derivative of the current has been obtained using a novel numerical method which allows determining the QPC model parameters. Once the procedure is completed, a whole RS series of thousands of curves is studied by means of a genetic algorithm. The extracted QPC parameter distributions are characterized in depth to get information about the filamentary pathways associated with LRS in the low voltage conduction regime.

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In this paper we propose an approximation method for solving second kind Volterra integral equation systems by radial basis functions. It is based on the minimization of a suitable functional in a discrete space generated by compactly supported radial basis functions of Wendland type. We prove two convergence results, and we highlight this because most recent published papers in the literature do not include any. We present some numerical examples in order to show and justify the validity of the proposed method. Our proposed technique gives an acceptable accuracy with small use of the data, resulting also in a low computational cost.