The escape depth of X-ray induced photoelectrons and Auger electrons has been measured for energies between 1 keV and 4 keV in metallic gold and aluminum oxide. The escape depth was found to be proportional to the square root of the electron energy and ranged from 19 Å (at 0.9 keV) to 37 Å (at 3.2 keV) in gold and from 13 Å (at 1.4 keV) to 22 Å (at 3.9 keV) in aluminum oxide.
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