This paper presents a comparative EMC susceptibility study of various integrated bandgap voltage reference cores. Conventional well-known bandgap references based on Kuijk, Brokaw and Tsividis concepts with reduced count of bipolar junction transistors in the core were analyzed. On top of the EMC susceptibility comparison, basic parameters like temperature drift, sensitivity to an operational amplifier input offset and line regulation are also discussed. The influence of a collector leakage current compensation at high temperatures is investigated as well.

This paper presents a comparative EMI susceptibility study of different integrated operational transconductance amplifier (OTA) topologies. We analyzed conventional well-known amplifier topologies based on the Miller OTA and folded cascode concepts with lower power consumption. The output dc voltage shifts induced by power supply and input common mode high frequency disturbances are presented. On top of the EMI susceptibility comparison, we discuss PSRR and CMRR within large and small excitation signal with a new simulation setup. Even more, the back-gate connections of differential MOS pair in OTA input stage are investigated for EMI susceptibility impact as well.