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Purpose -The purpose of this paper is to study the microwave interactions in polymer thick film resistors, namely, polyvinyl chloride (PVC)-graphite thick film resistors, and its applications in trimming of these resistors. Design/methodology/approach -We applied microwave radiation in the form of pulses of various pulse durations and with different powers to polymer thick film resistors and observed the variation of resistance of these resistors with microwave radiation. Findings -The paper finds that microwave radiation can be used for trimming of polymer thick film resistors. Research limitations/implications -The research implication of this paper is that polymer thick film resistors can be trimmed practically using this method. Practical implications -The practical implication of this paper is that we can trim the polymer thick film resistors, namely, PVC-graphite thick film resistor, by using this method. Originality/value -The value of the paper is in showing that microwave radiation can be used to trim downwards in the case of high-value resistors and trim upwards in the case of low-value resistors.

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In current trends the logos are playing a vital role in industrial and all commercial applications. Fundamentally the logo is defined as it's a graphic entity which contains colors textures, shapes and text etc., which is organized in some special visible format. But unfortunately it is very difficult thing to save their brand logos from duplicates. In practical world there are several systems available for logo reorganization and detection with different kinds of requirements. In some partial occlusions it should be robust to transfer the large range of photometric and geometric features of a logo which they are not captured in isolation. Two dimensional global descriptors are used for logo matching and reorganization. The concept of Shape descriptors based on Shape context and the global descriptors are based on the logo contours. There is an algorithm which is implemented for logo detection is based on partial spatial context and spatial spectral saliency (SSS). The SSS is able to keep away from the confusion effect of background and also speed up the process of logo detection. All such methods are useful only when the logo is visible completely without noise and not subjected to change. These types of methods are not suitable for practical images where insufficient resolution is the drawback of these methods. To overcome these drawbacks we proposed a multiple descriptors method along with context dependent similarity concept. The multiple descriptors are scale invariant feature transform (SIFT), Speeded up robust feature (SURF), histogram oriented gradient (HOG) and Gradient location and orientation histogram (GLOH). By using this method we assure high resolution and great accuracy.