Crystallization and melting in poly(ethylene oxide) are followed in real-time using hotstage atomic force microscopy (AFM). Hedritic morphology is observed at various stages of development. Lamellar growth rates are estimated and found to agree with values obtained by conventional optical microscopy. The presence of a depletion zone is detected at the crystal/melt interface.

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The processes of melting and crystallization of poly(ethylene oxide) are followed in real time at elevated temperature by atomic force microscopy using a simple hot stage apparatus. Hedritic development at a temperature of 5~7°C is monitored, including the process of lamellar splaying to yield a spherical morphology. Crystal growth kinetics are measured by monitoring the growth of individual lamellae and found to agree with those obtained by conventional optical microscopy.

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