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Recent developments in the theory and applications of the phase Doppler technique are reviewed. It is now possible to recognize particle material and to measure size and velocity of (i) metallic particles as small as 20 nm, (ii) transparent particles in the submicron range, and (iii) particles with refractive index approaching the surrounding medium. These diverse applications are met with an adaptive hardware for the phase/Doppler velocimeter (PDV), which is more flexible than the conventional device. Also software tools are introduced that provide a rigorous procedure to lay out the optics for various new and old applications. The effectiveness of the new measuring system is demonstrated through several examples.

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