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Thickness dependence of the electrical resistivity and the temperature coefficient of resistance (TCR) is reported for MnSb films in the thickness range 35 to 300 nm for different substrate temperatures. Films deposited at higher substrate temperatures exhibit marked size effect. The thickness dependence of the Curie temperaure also indicates some size effect. The experimental data are analysed using Fuchs‐Sondheimer and Mayadas‐Shatzkes theories.