We discuss procedures for calculating the signal-to-noise ratios and the dynamic ranges of terahertz time-domain spectrometers. We also offer recommendations for standardized calculations for time-domain and frequency-domain data.

The use of a single pass/fail threshold for IDDQ testing is unworkable as chip background currents increase to the point where they exceed many defect currents. This paper describes a method of using "current signatures" which uses only simple comparisons on the tester, and which automatically scales with process variations which give a wide range of background currents. Dynamic thresholds are used, based on the ratio of maximum to minimum current. Using a single IDDQ measurement for each die, upper and lower comparator values are set, against which IDDQ for each vector in the suite is compared. Production data is presented to verify the validity of the method.

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Terahertz (THz) reflectivities of a variety of metal-coated mirrors were measured. Gold, silver, and aluminum coatings were tested and compared. It was found that all types of optical metal-coated mirrors perform equally well as THz reflectors.