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Well-crystallized vanadium pentoxide V 2 O 5 thin films are fabricated on MgO single crystal substrates by using pulsed-laser deposition technique. The linear optical transmission spectra are measured and found to be in a wavelength range from 300 to 800 nm; the data are used to determine the linear refractive index of the V 2 O 5 films. The value of linear refractive index decreases with increasing wavelength, and the relationship can be well explained by Wemple's theory. The third-order nonlinear optical properties of the films are determined by a single beam z-scan method at a wavelength of 532 nm. The results show that the prepared V 2 O 5 films exhibit a fast third-order nonlinear optical response with nonlinear absorption coefficient and nonlinear refractive index of 2.13 × 10 −10 m/W and 2.07 × 10 −15 cm 2 /kW, respectively. The real and imaginary parts of the nonlinear susceptibility are determined to be 3.03 × 10 −11 esu and 1.12 × 10 −11 esu, respectively. The enhancement of the nonlinear optical properties is discussed.

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