Accurate optical method for measuring twist angle in TN LC cells is presented. Deviation of the measured values for different orientations of the cell and polarizes have been analyzed. The method allows to determine twist angle with high accuracy for cells with rubbed surfaces as well as for cells where at least one surface is corrugated.
The lifetime of the TN45 effect used in single panel LCOS imagers has been demonstrated to be 20,000 hours at 2 Mlux illumination. This paper will document the test methods used to determine this lifetime. The variation in lifetime under different illumination conditions will also be discussed.
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