A method for the estimation of sheet impedance of thin sample which does not require a direct contact with the sample under test is proposed. The surface impedance is calculated through an inversion procedure exploiting the scattering parameters obtained through a waveguide measurement setup. An inversion procedure based on the representation of the waveguide-air-waveguide section as a π junction is employed. In order to prevent the field leakage from the air gap created for hosting the thin sheet, an EBG surface is introduced on the flange of the waveguide. It is shown that the introduction of the EBG surface remarkably improves the estimation of the surface impedance of the thin sheet with respect to the case without EBG.

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