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A continuously averaging system is described in which a multichannel analyzer is coupled to an x-ray diffractometer. The motion of the arm of the diffractometer is synchronized with the channel advance so that there is a 1 to 1 correspondence between 2θ increments and channels. With this system a weak x-ray diffraction signal may be scanned repeatedly and the signal built up against the random noise introduced by fluctuations in the generating and detecting system with periods long compared to the channel dwell time. Other convenient uses of the analyzer in handling the x-ray diffraction data are briefly mentioned.

An x-ray premonochromator designed for a Picker vertical axis diffractometer is described. The system is designed to allow an easy conversion from the monochromator to the no-monochromator configuration. The straightforward alignment of the monochromator is discussed.

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Der Artikel beschreibt die Erfahrungen von Voith Paper bei der Durchführung von Sticky-Messungen mit der NIR-Messtechnik nach DIN SPEC 6745. Die Ergebnisse der von Voith Paper durchgeführten Messungen mit dem NIR-Makro-Sticky-Messgerät der Papiertechnischen Stiftung (PTS) Heidenau werden diskutiert und mit den Ergebnissen etablierter Messverfahren verglichen.