Recently, neural networks have acquired substantial relevance in defect location. The widespread use of neural networks began in the late 1980s and early 1990s. Normally, neural networks are used to improve defect detection, classification, and localization. There has been a lot of study and material written on fault location using neural networks. This research covers use of artificial neural networks (ANN) in identification of faults in EHV networks. We choose recent publications to uncover research gaps or expansions in the chosen study field.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.