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A new technique is developed to precisely measure the width of propagating voltage transients induced by irradiation of inverter chains. The technique is based on the measurement of the supply current in a detection inverter. Index Terms -Single Event Transient, chains of inverters, pulsed laser irradiation, SET width

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Techniques for removing the back substrate of SOI devices are described for both packaged devices and devices at the die level. The use of these techniques for microbeam, heavyion, and laser testing are illustrated.