We report a case of accidental intraocular lens (IOL) damage during a neodymium:YAG laser capsulotomy. After a single pulse of 0.9 mJ of laser energy, a large area of ripple-like opacity with more than 10 concentric circles surrounding a small hole in a 2.0 diopter IOL was noted. The opacity extended more than one fourth of the IOL diameter and caused a significant visual effect.

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-In recent IC designs, the risk of early failure due to electromigration wear-out has increased due to reduced feature dimensions. To give a warning of impending failure, wearout monitoring approaches have included delay measurement circuitry on-chip. Due to the high cost of delay measurement circuitry this paper presents a method to reduce the number of necessary measurement points. The proposed method is based on identification of wear-out sensitive interconnects and selects a small number of measurement points that can be used to observe the state of all the wear-out sensitive interconnects. The method is demonstrated on ISCAS85 benchmark ICs with encouraging results.