The supporting information is available free of charge.Grazing incidence X-ray diffraction patterns (GIXRD) of the [{Mo 6 I i 8 }I a 4 (H 2 O) a 2 ].xH 2 O photoelectrode, XPS analyses (wide-range spectra, I 3d, Mo 3d and Cs 4d) obtained on the MC film and the MC precursor powder and charge carrier lifetimes determined on the MC film via the OCP decay (file type, i.e., PDF).

0 ) Ions. -The title compounds are characterized by UV/VIS diffuse reflectance measurements, electron energy loss spectroscopy, and DFT calculations. From the measured and calculated values of the refractive indices, the extinction coefficients, and the imaginary parts of the dielectric functions of the compounds it is concluded that only CeO 2 presents a proper absorption edge for an UV absorber, whereas SrCeO 3 and Sr 2 CeO 4 are unsuitable for UV absorption applications. -(GOUBIN, F.; ROCQUEFELTE, X.; WHANGBO, M.-H.; MONTARDI, Y.; BREC, R.; JOBIC*, S.; Chem.

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