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Angle-dependent X-ray photoelectron spectroscopy (XPS) is an effective method to obtain structural information about a given surface of a single crystal and metal epitaxial layers. We have used this method to study the molecular stacking of a lipid-free copper phthalocyanine tetrasulphonate (CuTsPc) multilayer system. On the basis of two enhanced peaks found in the angle-dependent XPS spectrum recorded from a system of 11 CuTsPc monolayers on gold and the mechanism of enhancement, we suggest face-to-face stacking of the CuTsPc molecules, with copper atoms stacked in the direction at 15 ° with respect to the normal of the molecular plane. This stacking also provides a good explanation of the electrical conductivity of this multilayer system.

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