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The structural parameters, the axial thermal expansion coefficients and the characteristic Debye temperatures for the order vacancy compound CuGa 5 Se 8 with the chalcopyrite-related structure, prepared by the Bridgman technique, were determined at different temperatures between 90 and 650 K by the X-ray diffraction method. The melting point of this compound was defined from the differential thermal analysis data. The anisotropy of thermal expansion in CuGa 5 Se 8 is shown to exist with the coefficients along a-axis being larger than those along the c-axis throughout the temperature range studied.