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Two-probe electronic transport measurements on a Molybdenum Disulphide (MoS 2 ) surface were performed at low temperature (30K) under ultra-high vacuum conditions. Two scanning tunneling microscope tips were precisely positioned in tunneling contact to measure the surface current-voltage characteristics. The separation between the tips is controllably varied and measured using a high resolution scanning electron microscope. The MoS 2 surface shows a surface electronic gap (E S ) of 1.4eV measured at a probe separation of 50nm. Furthermore, the two-probe resistance measured outside the electronic gap shows 2D-like behavior with the twoprobe separation.