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Double-biprism electron interferometry has been extended by enabling the control of azimuth rotation between the two filament electrodes of the biprisms. Varying the azimuth angle between the filaments induces two parameters not found in conventional electron interferometry: the azimuth angle of the interference fringes and the vertical length of the interference region. This extended interferometry enables us to obtain the phase profile of one-dimensionally structured materials widely along their elongated direction without reconstruction. Evaluation of the overall performance of the interferometry theoretically and experimentally demonstrated that it provides additional flexibility for interferometry.

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