First phase formation has been determined in Cu binary thin film systems with Ti, Zr, Mg, Sb, Pd, and Pt using transmission electron microscopy and Rutherford backscattering spectrometry. CuTi, CuZr, CuMg2, Cu$b, CusPd, and CusPt are the first phases to form upon annealing the Cu/metal bilayers. The effective heat of formation model is used to predict first phase formation Cu-metal in 14 Cu/metal systems.
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