A new apparatus for total scattering measurements has been developed with a variable camera length using a 16-inch two-dimensional flat-panel detector to observe structural changes in amorphous and disordered crystalline materials substantially in real time on beamlines BL08W and BL04B2 at SPring-8. This paper presents the successful time-resolved pair distribution function analysis at SPring-8, and a newly developed program for data conversion from two-dimensional images into one-dimensional total scattering patterns.

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