We demonstrate the monitoring of plant nutrients in leaves of Citrus unshiu and Rhododendron obtusum using low-energy (<1 mJ) laser-induced breakdown spectroscopy. The raw plant leaf was successfully ablated without desiccation before laser irradiation, by applying metallic colloidal particles to the leaf surface. The emission intensity with the metallic particles was larger than that without the particles. This result indicates an improvement of the sensitivity and the detection limit of laser-induced breakdown spectroscopy. The emission enhancement was caused by localized surface plasmon resonance and was dependent on the size and material of metallic particles.

No abstract

For evaluation of on-site dosimetry and process design in industrial use of ultra-low energy electron beam (ULEB) processes, we evaluate the energy deposition using a thin radiochromic film and a Monte Carlo simulation. The response of film dosimeter was calibrated using a high energy electron beam with an acceleration voltage of 2 MV and alanine dosimeters with uncertainty of 11% at coverage factor 2. Using this response function, the results of absorbed dose measurements for ULEB were evaluated from 10 kGy to 100 kGy as a relative dose. The deviation between the responses of deposit energy on the films and Monte Carlo simulations was within 15%. As far as this limitation, relative dose estimation using thin film dosimeters with response function obtained by high energy electron irradiation and simulation results is effective for ULEB irradiation processes management.

We report small reflecting mirrors with high reflectance, which are fabricated by using square quartz chips. These quartz mirrors are going to be used in the construction of a miniaturized Fabry Perot Interferometer (FPI) with a commercial ring type PZT from Fuji Ceramic Company. The dimension of quartz substrates is 10×10mm with a thickness of 1mm. The high reflectance of mirrors is obtained by depositing multi-layer thin films on quartz substrates. Magnetron RF sputtering machine is used to ensure that the thickness of dielectric coatings can be precisely controlled. These mirrors are measured by SEM and AFM and the reflectance is detected by a visible light spectrometer. The maximum reflectance of these mirrors is about 99.4% on the designed wavelength 553nm. A small FPI set up by this kind of mirror can have a theoretical finesse of 522, and if a PZT resonator with a length of 7.22mm is used, the resolution of this small interferometer can reach 4.06×10 -5 nm, in another word, the resolving power is 1.36×10 7 .

No abstract