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In this tutorial review we present in detail recent studies in which molecular junctions were simultaneously probed by conductance measurements and optical spectroscopy methods such as electroluminescence (EL) and Raman scattering. The advantages of combining these experimental approaches to improve our understanding of charge transport through molecular junctions are discussed and routes for future developments are suggested.

A high throughput fabrication method of molecular junctions with a typical area of 0.005–0.01μm2 is presented. The small size is determined by one optical lithography step. The structure of junctions is metal-SAM-metal, where SAM is a self-assembled molecular layer with <105 molecules. The effect of attributes such as temperature, type of metal films, and molecular structure of the SAM on the I-V characteristics of the junctions is found to be in agreement with previous results and theoretical predictions. The prospect advantages of the junctions for future research are also mentioned.

Spectroscopy of Moelcular Junctions -[56 refs.]. -(SHAMAI, T.; SELZER*, Y.; Chem. Soc. Rev. 40 (2011) 5, 2293-2304, http://dx.doi.org/10.1039/c0cs00155d ; Sch. Chem., Tel Aviv Univ., Tel Aviv 69978, Israel; Eng.) -Lindner 32-260