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Radiofrequency (RF) power amplifiers (PAs) are important elements of modern communication systems. The most important components in PAs are the transistors, which are operated under large-signal regimes in such applications. Designing and optimizing PAs are challenging tasks that demand the highest accuracy on large-signal measurements at both device and circuit levels. Large-signal power transistor characterization demands the development and utilization of high-frequency and low-frequency load-pull systems. Furthermore, the static and dynamic characterization of two-input PAs requires the development of new measurement systems that consist of an nonlinear vector network analyzer (NVNA) and an arbitrary waveform generators (AWG). This paper reviews the research activities, achievements, and current research goals at CICESE Research Center in Mexico in the large-signal microwave metrology field.

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