It has been shown that phase-locked cavities have a quantised transfer function (Jennison 1979) and that they account for the property of inertia (Jennison and Drinkwater 1977). The analysis in this paper shows that only half of the rest energy of a phase-locked cavity contributes actively to the inertial force. The moment of inertia of such a system about its own axis is only half that of a classical rigid body of the same total rest mass distributed in the same region of space. If a phase-locked cavity is used as a model of a fundamental particle then it is concluded that the particle is a fermion with a rest mass corresponding to its total rest energy.
SAW filters in a structure of ZnO/IDT/glass, have periodic convex and concave roughness on the surface of ZnO thin films which is caused by IDT electrodes. This investigation reports that the convex and concave roughness affects the SAW velocity, and mechanical polishing of the ZnO thin films has great effect on SAW filter frequency characteristics.
Lanthanum-modified lead-titanate (Pbo.85Lao.1Ti03) thin films were fabricated by rf magnetron sputtering on various kinds of substrates such as single-crystal MgO (100), r-plane sapphire and SI (100) with an MgO thin film layer. All the films were able to be evaluated using nickel alloy electrodes which possess low reactivity with PbO, excellent heat-resistance and oxidation-resistance. The quality of these films was affected by the kind of substrate and crystal orientation of nickel alloy electrode used. Furthermore, by controlling the crystal orientation of the alloy electrode, films on Si (100) with an MgO (100) layer showed good ferroelectricity.
PbTiO3 films were prepared by rf magnetron sputtering at various sputtering conditions. It was found that the composition of deposited films is strongly dependent on the sputtering gas pressure and the gas ratio of Ar/O2, and that the crystal orientation of the film is decided by the substrate, the substrate temperature and the target composition. A-axis oriented PbTiO3 film was fabricated on the substrate of the quartz glass where tensile stress occurred against the film. During the sputtering, plasma spectra of PbTiO3 were measured by optical emission spectroscopy. Pb vaporization from the substrate could be observed by this method, and consequently the formation mechanism of PbTiO3 film was investigated.
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