Using the spin Hall effect of light, this work proposes a measurement technique of the magnetic properties of thin films. The beam shift of the spin Hall effect of light is used to replace the magneto-optical Kerr rotation angle as a parameter to characterize the magnetism of thin films. The technique can easily achieve an accuracy of 10−6 rad of the magneto-optical Kerr rotation angle which can, in theory, be further improved to 10−8 rad. We also proposed two methods to solve the problem of the exceeding linear response region of the measurement under high magnetic field intensity, making it more conducive to practical application. This technique has great potential for application in the magnetic measurement of ultra-thin films with particular emphasis on thicknesses within several atomic layers.