The paper considers issues of using information technologies for solving problems of certification and licensing of the enterprises of electronic industry, conducting advanced research and analysis of sales. The structure of the database and identify the steps of adding information.

The methods of design of digital fault-tolerant bipolar integrated circuits to exposure to radiations such as gamma, x-ray and neutron radiation are considered, as well as the impact of the neutron pulse, which af-fect largely on the gain of the transistor. The operating mode of integrated circuits with change in the ini-tial values of voltages, as well as currents of the emitter and of the base is presented. Numerical calcula-tions of the ionization current in the base-collector junction are considered which allow pre-calculate dose rate of gamma, x-ray and neutron radiation.

Is considered a functional diagram of the algorithm of modeling and creation of failure tolerance scratch pad memory VLSI.

The paper presents the numerical values of the redistribution of temperature for typical structures of chips and transistors. Determined that the transistors can be a temporary loss of working capacity

The technique of radiation-resistant design of integrated circuits in computer-aided design is presented and comparisons with expert data are provided, which are affected by these types of radiations like gam-ma, x-ray and neutron radiation, as well as the impact of the neutron pulse, which affect largely, on the gain of the transistor are examined. Different types of cardinality doses are represented that affect the crystals of integrated circuits based on the real pulse shape of artificial intelligence.