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The paper considers problems of modeling the basic elements of micro-schemes, creation of mathematical, informational and software taking into account the division of responsibilities between enterprises and modeling capabilities of ionizate-organizational and structural effects.

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The paper discusses the changes in the circuit parameters under the influence of low-intensive radiation of space factors. Lighted modeling of process of accumulation of defects for low-intensity radiation.

The paper deals with the issues of resistance of linear voltage stabilizers to the influence of special factors. The conducted researches are described, electric schemes at measurement of output voltage and current of chips are resulted. The calculated estimates of the resistance of linear voltage stabilizers to the influence of various special factors are also considered