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We demonstrate that dual-channel spectral interferometry in conjunction with a well-characterized reference pulse can be used to time resolve the polarization state of extremely weak ultrashort coherent signals from linear-and nonlinear-optical experiments by measuring the intensity and the phase of two orthogonal polarization components. In this way the signal is completely characterized.

We present a novel structured pattern projection tool for stress, and topography measurement of solar cells. The presented tool has expanded (two standard deviations) accuracy and repeatability of 0.5 mm, exceeding current industry requirements (±0.05 mm one standard deviation). Measurements on the R&D system indicate that this technology is capable of performing measurements with a throughput exceeding 2000 wafers per hour.

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