W. Ladisich scite author profile

High‐purity copper samples were irradiated with high‐energy protons and neutrons. The concentration of transmutational elements was measured by means of the total reflection x‐ray fluorescence method using synchrotron radiation. The spectra of non‐irradiated samples were substracted from the spectra of the irradiated samples. By this evaluation method, the minimum detectable concentration was as low as 1.5 μg g−1 in a copper matrix.

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Txrf - Sources - Samples and Detectors

Wobrauschek¹,

Kregsamer²,

Ladisich³

et al. 1997

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W. Ladisich

Total reflection X-ray fluorescence analysis with monoenergetic excitation and full spectrum excitation using rotating anode X-ray tubes

Total-reflection X-ray fluorescence analysis using special X-ray sources

Total reflection X-ray fluorescence analysis of light elements using synchrotron radiation

Detection of transmutational elements in copper by means of total reflection x‐ray fluorescence spectrometry using synchrotron radiation

Txrf - Sources - Samples and Detectors

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