The possibility of extending the Rietveld method to incorporate textured polycrystalline materials is demonstrated with a zircaloy sample. By assigning the pole densities obtained by separate texture analysis to the preferred orientation factors (POFs) in the mathematical model of the Rietveld method, good pro®le re®nement results are achieved with the neutron diffraction patterns. The approach of predetermining the individual POF values from quantitative texture information can be used to improve re®nement of other parameters related to the analysis of composite phases as well as to crystal structure re®nement.

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