The main challenges of high-resolution ADC testing are the huge number of samples and the expensive test equipment, especially the requirement of high linearity signal source. In this paper, the scaling and segmentation algorithm which combines SEIR with windows is introduced for high-resolution ADC test. The new approach is validated by simulation with a 24-bit sigma-delta ADC. INL error of the proposed method is ±0.2LSB, which is less than the SEIR method of ±0.5LSB,and less than the histogram method of ±0.3LSB. About 20 million samples are required in the proposed method, which is about 30 times less than the traditional histogram method.