No abstract

The polarization suppression of the interfering components in X-ray multiple-wave interaction is observed for the first time by using a polarization analyzer with an arbitrary inclination of the diffraction plane with respect to that of the investigated crystal. The condition for total suppression of the multiple-wave interaction outside the investigated crystals by a polarization analyzer is derived theoretically from the modified Born approximation. By means of the partial suppression of the strong interfering component, the increase in the visibility of multiple-wave interference is experimentally and theoretically demonstrated. The proposed experimental polarization-resolved technique provides an operational way to enhance the visibility of X-ray multiple-wave interaction outside the investigated crystals for direct phase determination.

The phenomenon of the polarization suppression of X-ray Umweg multiple waves in Renninger scans [Renninger (1937). Z. Kristallogr. 97, 107-121] of crystals, showing intensity decrease due to properly chosen wavelength and polarization of incident radiation, is observed. That is, one of the participating wave components in the multiple-wave interference is reduced considerably so that the intensity of multiple diffraction is decreased. The condition for total suppression of the multiple-wave interaction in crystals is derived theoretically from the Born approximation and verified with exact dynamical calculation and experiments. Partial suppression of the strong Umweg interfered component is demonstrated using elliptically or linearly polarized synchrotron radiation. The suppressed multiple-wave intensity distribution reveals high sensitivity to X-ray reflection phase. This multiple-diffraction technique under partial polarization suppression provides an alternative way of enhancing the visibility of multiple-wave interference in crystals for direct phase determination.

No abstract

No abstract