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Waveforms of digital single-event transients, radiation-induced voltage transients in logic gates, can be observed by connecting two transistors to a target logic gate. Additional transistors monitor voltage transients through their drain currents, which can be measured using the conventional 50-transmission-line technique widely used for measuring transient currents in single elementary transistors. Experimental results obtained in pulsedlaser irradiation tests demonstrate the validity of the observation technique and clearly reveal the pulse evolution as a function of the laser pulse energy.

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