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The integration of low-voltage data collection system is relatively high, and there are some problems such as long distance between nodes. Therefore, while testing the operation reliability of the system, it is often difficult to analyze and the accuracy is low because of power consumption. Based on that, a reliability analysis method for low-voltage centralized reading system based on LoRa technology is proposed in this paper. Under LoRa framework protocol, the evaluation index of system reliability is defined, and the running state of the system is determined by calculating the state transition rate, the stationary state probability and the instantaneous state of the components. With this basis, the load carrying capacity of each node and the risk of voltage collapse are calculated respectively. Through setting up control group and experimental group to carry out detailed empirical analyses, the reliability analysis results of the system are obtained. Through comparison, it is found that the average analysis accuracy of the system operation reliability analysis method designed is 25% higher than that of the traditional method.

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The EMC accordance in Power Electronics (PE) equipment depends more the character of the semiconductor devices who work as the switchers than in other electronic equipment because the switching of the semiconductor device in PE may be the main cause of EMI. This paper proposes a novel approach that acquires PE equipment signal waveform by an oscilloscope, and analyzes the signal with Continuous Wavelet Transform (CWT), which can diagnose device's characteristics effects on equipment EMI. The algorithms of proposed approach are given followed by a case study, proving the feasibility of the proposed approach.

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